Although still in the qualifying rounds, U.S. researchers are helping manufacturers win the race to develop low-cost ways to commercialize a multitude of products based on inexpensive organic electronic materials--from large solar-power arrays to electronic newspapers that can be bent and folded.
In the on-line issue of Advanced Materials,* researchers from the National Institute of Standards and Technology (NIST) and the University of California at Berkeley report success in using a non-destructive measurement method to detail three structural properties crucial to making reliable electronic devices with thin films of the carbon-rich (organic) semiconductors. The new capability could help industry clear hurdles responsible for high manufacturing development costs that stand in the way of widespread commercial application of the materials.
With the technique called near-edge X-ray absorption fine-structure spectroscopy, or NEXAFS, the team tracked chemical reactions, molecular reordering and defect formation over a range of processing temperatures.
Mark Bello | EurekAlert!
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