For two-dimensional film thickness determination, a measurement system based on a hyperspectral imager has been developed for the first time. A head forms a measurement line. Reflection of the measurement object is displayed on the entrance slit of the hyperspectral imager. From the spectral reflectance data of each locally resolvable pixel of the examined object the layer height is reconstructed. If the measurement object is moving uniformly, combined measurement lines are resulting in a two-dimensional measuring surface. In addition, for each locally resolvable pixel the distance between head and measurement object can be determined.
Further information: PDF
Bayerische Patentallianz GmbH
Phone: +49 89 5480177-0
As Germany's association of technology- and patenttransfer agencies TechnologieAllianz e.V. is offering businesses access to the entire range of innovative research results of almost all German universities and numerous non-university research institutions. More than 2000 technology offers of 14 branches are beeing made accessable to businesses in order to assure your advance on the market. At www.technologieallianz.de a free, fast and non-bureaucratic access to all further offers of the German research landscape is offered to our members aiming to sucessfully transfer technologies.
email@example.com | TechnologieAllianz e.V.
New Lithium Salts of Pentafluorophenylamide Anions as Electrolytes in Lithium Ionic Batteries
18.04.2017 | TechnologieAllianz e.V.
Gratings on glass surfaces
28.03.2017 | TechnologieAllianz e.V.
19.09.2017 | Event News
12.09.2017 | Event News
06.09.2017 | Event News
20.09.2017 | Life Sciences
20.09.2017 | Power and Electrical Engineering
20.09.2017 | Physics and Astronomy