Evanescent wave lithography enables optical imaging to smallest-ever level
A new computer chip lithography method under development at Rochester Institute of Technology has led to imaging capabilities beyond that previously thought possible.
Leading a team of engineering students, Bruce Smith, RIT professor of microelectronic engineering and director of the Center for Nanolithography Research in the Kate Gleason College of Engineering, developed a method—known as evanescent wave lithography, or EWL—capable of optically imaging the smallest-ever semiconductor device geometry. Yongfa Fan, a doctoral student in RIT’s microsystems engineering Ph.D. program, accomplished imaging rendered to 26 nanometers —a size previously possible only via extreme ultraviolet wavelength, Smith says. By capturing images that are beyond the limits of classical physics, the breakthrough has allowed resolution to smaller than one-twentieth the wavelength of visible light, he adds.
Michael Saffran | EurekAlert!
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