This image shows a carbon nanotube attached to a conventional silicon tip used on an instrument called an atomic force microscope, which is used to measure tiny features on the scale of nanometers. Forces between individual atoms called van der Waals forces cause the flexible, vibrating probe to stick to the sides of the tiny structures, producing "artifacts," or inaccuracies in the final image. Purdue researchers have shown how to avoid the sticking action and prevent certain artifacts so that nanotubes can be better used in the emerging field of "nanometrology." (Purdue School of Mechanical Engineering)
This image shows a comparison between an image taken with a conventional silicon tip (left) and a nanotube, both used on an atomic force microscope to scan the surface of an object to measure tiny contours on the scale of nanometers. While nanotubes are more slender and flexible than the silicon tips, making them ideal to reach into the nooks and crannies of nano-structures, the tubes have a tendency to stick to the sides of the structures because of forces between individual atoms called van der Waals forces. The sticking action results in "artifacts," or inaccuracies in the final image. The image on the left shows an image taken with a conventional tip, and the other image shows an example of artifacts caused by the sticking action. Purdue researchers have shown how to avoid the sticking action and prevent certain artifacts so that nanotubes can be better used in the emerging field of "nanometrology." (Purdue School of Mechanical Engineering)
Engineers at Purdue University have shown how researchers might better use tiny hollow fibers called "multi-walled carbon nanotubes" to more precisely measure structures and devices for electronics and other applications. Findings will appear in the November issue of the journal Nanotechnology.
Researchers attach the tubes to the ends of imaging instruments called atomic force microscopes. Because the tubes are long and slender, their shape is ideal for the emerging field of "nanometrology," which is precisely measuring structures on the scale of nanometers, or billionths of a meter.
Conventional silicon tips used on the microscopes are shaped like inverted traffic cones. They are fine for measuring relatively flat surfaces, but they do not readily penetrate crevices that often exist in tiny devices and structures, said Arvind Raman, an associate professor of mechanical engineering at Purdue. The silicon tips also wear out quickly, reducing image resolution, whereas the carbon nanotubes have been shown to retain their accuracy after many hours of use, said mechanical engineering doctoral student Mark Strus.
Emil Venere | EurekAlert!
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