Forum for Science, Industry and Business

Sponsored by:     3M 
Search our Site:

 

Nanolane revolutionises conventional microscopes with Sarfus Mapping Lite

21.02.2012
Nanolane of France, a specialist in the development and commercialisation of optical solutions for characterising nanomaterial systems, has launched Sarfus Mapping Lite — an innovative measurement solution that fits with any optical microscope set-up functioning with reflected light.

French-based Nanolane has recently created easy-to-use Sarfus Mapping Lite, a plug-in piece of apparatus, the main components of which are a set of Surf microscope slides, step-height standards and a powerful piece of software. Sarfus Mapping Lite fits with all optical microscopes that use reflected light. Thanks to the technology developed by Nanolane, what has remained invisible to an optical microscope for so long is now revealed clearly.

Surf slides replace ordinary microscope glass slides and are where users deposit samples. The users then handle the optical microscope as usual, apart from the fact that the contrast enhancement brought about by Surf is such that they can see nano-objects in the shape of films, tubes or particles directly through eyepieces, i.e. with the naked eye.

The data conversion software included in the Sarfus Mapping Lite package takes a Charged Coupled Device (CCD) camera-obtained 2D colour image and provides a 3D thickness map of a nanometric sample. To do so, the optical instrument, i.e. the combination of the optical microscope and colour camera, is calibrated. This calibration occurs thanks to a series of nanometric step-height standards that are traceable to the ISO 17025 standard. These standards mean that a detection limit, which can be as high as 0.1nm (instrument dependent), is guaranteed.

Up until now, Surf-slide users were able to sense and image nanometric objects, such as nanotubes, nanowires, DNA strands, and nanoparticles. With Sarfus Mapping Lite, they will also be able to measure thin films and surface treatment of items with nanometric thickness.

The benefits one gains from adding Sarfus Mapping Lite to a microscope, as compared to the current nanocharacterisation or imaging tools, are, above all, related to its excellent accessibility and user friendliness.

Real-time image acquisition makes it possible to record fast dynamic phenomena, depending on the camera's capacities. A selectable field of view, ranging from a few µm² to several mm², depending on magnification, gives users the flexibility to study their samples globally. This global studying is useful for locating regions of interest (ROIs). The selectable field of view also allows samples to be studied locally, so as to investigate micro- to sub-micro-details. Additionally, the viewing technique is non-contact in nature and, therefore, truly non-destructive.

Applications of Sarfus Mapping Lite are many, from thin-film characterisation (for organics, inorganics, liquid crystals and lithography) to biological systems (such as biochips and biofilms), among many others. More fundamental research-related applications include nanopatterns, Langmuir-Blodgett films, and self-assembled monolayers(SAMs), for example.

About Nanolane

Nanolane, the nanotechnologies department of Eolane of France, develops and sells scientific instruments and scientific-related consumables in the field of nanotechnology.

Eolane is an electronic manufacturing services (EMS) business whose 2,400 members of staff, working for its many subsidiaries, generate an annual turnover of about €300 million. Eolane operates in a range of complementary fields encompassing technology and industry.

Nanolane's Sarfus Mapping Lite is a package that includes a number of items, with, in particular, a set of Surf slides, some step-height standards, and a powerful piece of software. It fits with all optical microscopes that use reflected light, allowing what has remained invisible to an optical microscope for so long to be clearly revealed.

For further information about Eolane, please go to: www.eolane.com

For further information about Surfs, please go to: www.nano-microscopy.com

For further information about Nanolane, please go to: www.nano-lane.com

For further information, please contact :

Quote ref. : FTPB3696
Ms Katherine WOODS - Press Officer
UBIFRANCE Press Office in London
Tel: +44 (0) 207 024 3640
katherine.woods@ubifrance.fr

Katherine Woods | UBIFRANCE
Further information:
http://www.ubifrance.com/uk/

More articles from Innovative Products:

nachricht Winter Hack: Textured Rubber that Grips Slick, Icy Surfaces
18.03.2015 | American Institute of Physics (AIP)

nachricht Turn sea-water into drinking water – just add sunshine
02.12.2014 | Desolenator

All articles from Innovative Products >>>

The most recent press releases about innovation >>>

Die letzten 5 Focus-News des innovations-reports im Überblick:

Im Focus: Fast and Accurate 3-D Imaging Technique to Track Optically-Trapped Particles

KAIST researchers published an article on the development of a novel technique to precisely track the 3-D positions of optically-trapped particles having complicated geometry in high speed in the April 2015 issue of Optica.

Daejeon, Republic of Korea, April 23, 2015--Optical tweezers have been used as an invaluable tool for exerting micro-scale force on microscopic particles and...

Im Focus: NOAA, Tulane identify second possible specimen of 'pocket shark' ever found

Pocket sharks are among the world's rarest finds

A very small and rare species of shark is swimming its way through scientific literature. But don't worry, the chances of this inches-long vertebrate biting...

Im Focus: Drexel materials scientists putting a new spin on computing memory

Ever since computers have been small enough to be fixtures on desks and laps, their central processing has functioned something like an atomic Etch A Sketch, with electromagnetic fields pushing data bits into place to encode data.

Unfortunately, the same drawbacks and perils of the mechanical sketch board have been just as pervasive in computing: making a change often requires starting...

Im Focus: Exploding stars help to understand thunderclouds on Earth

How is lightning initiated in thunderclouds? This is difficult to answer - how do you measure electric fields inside large, dangerously charged clouds? It was discovered, more or less by coincidence, that cosmic rays provide suitable probes to measure electric fields within thunderclouds. This surprising finding is published in Physical Review Letters on April 24th. The measurements were performed with the LOFAR radio telescope located in the Netherlands.

How is lightning initiated in thunderclouds? This is difficult to answer - how do you measure electric fields inside large, dangerously charged clouds? It was...

Im Focus: On the trail of a trace gas

Max Planck researcher Buhalqem Mamtimin determines how much nitrogen oxide is released into the atmosphere from agriculturally used oases.

In order to make statements about current and future air pollution, scientists use models which simulate the Earth’s atmosphere. A lot of information such as...

All Focus news of the innovation-report >>>

Anzeige

Anzeige

Event News

HHL Energy Conference on May 11/12, 2015: Students Discuss about Decentralized Energy

23.04.2015 | Event News

“Developing our cities, preserving our planet”: Nobel Laureates gather for the first time in Asia

23.04.2015 | Event News

HHL's Entrepreneurship Conference on FinTech

13.04.2015 | Event News

 
Latest News

Electrons Move Like Light in Three-Dimensional Solid

24.04.2015 | Materials Sciences

Connecting Three Atomic Layers Puts Semiconducting Science on Its Edge

24.04.2015 | Materials Sciences

Understanding the Body’s Response to Worms and Allergies

24.04.2015 | Health and Medicine

VideoLinks
B2B-VideoLinks
More VideoLinks >>>