GE´s compact sized nanoCT® system phoenix nanotom m
nanoCT® of through-silicon-vias (50 µm diameter) in an electronic package revealing voids in the copper filling
The phoenix nanotom m, from GE´s Inspection Technologies business, has been developed to fulfill the fast growing demand for high resolution and high precision X-ray computed tomography (CT) in non-destructive 3D analysis.
Featuring fully automated CT scan execution, volume reconstruction and the analysis process, it offers ease of use as well as fast and reproducible CT results, in applications ranging from small electronic packages to medium sized electronic assemblies.
As Oliver Brunke, product manager for CT at GE’s Inspection Technologies business says, “Compared with current state-of-the-art phoenix|x-ray nanoCT equipment, the new phoenix system provides significantly better object penetration and image sharpness, as well fewer imaging artifacts and anomalies because of its extremely high long-term stability. Moreover, due to its excellent contrast-to-noise ratio, CT scans can be performed up to four times faster for the same resolution and image quality.”
The nanotom m incorporates a new phoenix 180kV/15W, high-power nanofocus X-ray tube, which is optimized for long-term stability and allows scanning of high absorbing materials such as metals and ceramics. The internal cooling of the tube also significantly reduces thermal effects such as drift, to ensure even sharper imaging as well as allowing the long scanning times frequently required in scientific research.
The new CT system also features a very high dynamic range, typically five times better than current state-of-the-art nanoCT equipment, because of its temperature-stabilized, 3072 x 2400 pixel DXR 500L detector from GE. With such a large detector area, this allows sample sizes of up to 250 x 240 mm and the combination of proprietary GE technology in terms of X-ray tube, detector, generator and CT software ensures that a voxel size of down to 300 nm (0.3 µm) can be achieved.About GE Measurement & Control Solutions
For further information visit, www.ge-mcs.com/phoenixContact for readers' questions
13.02.2017 | Event News
10.02.2017 | Event News
09.02.2017 | Event News
27.02.2017 | Materials Sciences
27.02.2017 | Interdisciplinary Research
27.02.2017 | Life Sciences