Stephen Goodwins wheat research may lead to a reduction in the amount of grain lost to leaf blotch. Goodwin is an associate professor of botany and plant pathology at Purdue University. (Agricultural Communications photo/Tom Campbell)
Bread wheat plants carrying a newly discovered gene that is resistant to economically devastating leaf blotch can reduce the amount of grain lost to the pathogen, according to Purdue University researchers.
The scientists used bread wheat species to find the gene and the markers, or bits of DNA, that indicate presence of the naturally occurring gene. The fungus causes wheat crop damage worldwide with yield losses of 50 percent or more in some places. In the United States the disease is widespread in the Pacific Northwest, the northern Great Plains and the eastern Midwest soft wheat region, and experts estimate annual losses at $275 million.
Results of the Purdue study on resistance to the fungus that causes Septoria tritici leaf blotch are published in the September issue of Phytopathology and appear on the journal’s Web site.
Susan A. Steeves | Purdue News
New 3-D model predicts best planting practices for farmers
26.06.2017 | Carl R. Woese Institute for Genomic Biology, University of Illinois at Urbana-Champaign
Fighting a destructive crop disease with mathematics
21.06.2017 | University of Cambridge
Strong light-matter coupling in these semiconducting tubes may hold the key to electrically pumped lasers
Light-matter quasi-particles can be generated electrically in semiconducting carbon nanotubes. Material scientists and physicists from Heidelberg University...
Fraunhofer IPA has developed a proximity sensor made from silicone and carbon nanotubes (CNT) which detects objects and determines their position. The materials and printing process used mean that the sensor is extremely flexible, economical and can be used for large surfaces. Industry and research partners can use and further develop this innovation straight away.
At first glance, the proximity sensor appears to be nothing special: a thin, elastic layer of silicone onto which black square surfaces are printed, but these...
3-D shape acquisition using water displacement as the shape sensor for the reconstruction of complex objects
A global team of computer scientists and engineers have developed an innovative technique that more completely reconstructs challenging 3D objects. An ancient...
Physicists have developed a new technique that uses electrical voltages to control the electron spin on a chip. The newly-developed method provides protection from spin decay, meaning that the contained information can be maintained and transmitted over comparatively large distances, as has been demonstrated by a team from the University of Basel’s Department of Physics and the Swiss Nanoscience Institute. The results have been published in Physical Review X.
For several years, researchers have been trying to use the spin of an electron to store and transmit information. The spin of each electron is always coupled...
What is the mass of a proton? Scientists from Germany and Japan successfully did an important step towards the most exact knowledge of this fundamental constant. By means of precision measurements on a single proton, they could improve the precision by a factor of three and also correct the existing value.
To determine the mass of a single proton still more accurate – a group of physicists led by Klaus Blaum and Sven Sturm of the Max Planck Institute for Nuclear...
26.07.2017 | Event News
21.07.2017 | Event News
19.07.2017 | Event News
26.07.2017 | Physics and Astronomy
26.07.2017 | Life Sciences
26.07.2017 | Earth Sciences